Instrument Name：Semiconductor characteristic analyzer
Serial number for instruments：20092465
specifications and models：4200-SCS
Date of purchase：2009/3/19
Parameters：Unique remote preamplifier, will SMU.The resolution is extended to 0.1fA；; Support various peripheral devices such as Keithley590 and Agilent 4284 C-V instruments, Keithley switch matrix and Agilent 81110 pulse generator; Hardware is controlled by Keithley interactive test loop (KITE). The 8860 automatic and manual probe station supporting Cascade Microtech Summit12K series, Karl Suss PA-200 and micromanipulator.
Functions：The easy-to-use 4200-SCS semiconductor characteristic analysis system is used for DC parameter test, real-time drawing and analysis of devices at laboratory level, with high precision and sub-fA resolution. It provides the most advanced system integration capabilities, including complete embedded PC, Windows operating system and mass storage. Its automatic recording and click interface accelerates and simplifies the process of obtaining data, so that users can start analyzing test results more quickly. Some other features make the stress measurement function meet the requirements of various reliability tests.
